Subject: Electron microscopy

FAST ID: 906682 | WorldCat Record

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Electron beam-induced nanopores in Bernal-stacked hexagonal boron nitride

Mehmet Dogan; et al.

Applied Physics Letters, 2020, journal article

Applied Physics Letters (2020)

SJR: 0.8560
H-index: 498
Publisher: American Institute of Physics
ISSN: 10773118, 00036951
Coverage: 1962-2026

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Discipline	Overall Quartile
Not reported	Q1

A discipline-specific ranking was unavailable; the title-level overall quartile is shown.

Cited by 11
Physics

Boron nitride Electron beams Electron microscopy Nanopores Nanostructured materials

In situ TEM characterization of shear-stress-induced interlayer sliding in the cross section view of molybdenum disulfide

Oviedo, J.P.; Santosh KC; et al.

ACS Nano, 2015, journal article

ACS Nano (2015)

SJR: 4.1020
H-index: 531
Publisher: American Chemical Society
ISSN: 1936086X, 19360851
Coverage: 2007-2026

Journal quartile details
Discipline	Overall Quartile
Not reported	Q1

A discipline-specific ranking was unavailable; the title-level overall quartile is shown.

Cited by 131
Mechanical Engineering GREW Fellow

Electron microscopy Materials science Molybdenum disulfide Transmission electron microscopy